Visitas IEEE 22.11.2006

Programa Visita de Investigadores IEEE 22/11/2006

Charla Dr. Liou	Charla Dr. Iwai
Robust Electrostatic Discharge (ESD) Protection in CMOS Technology Juin J. Liou Professor, Dept. of Electrical and Computer Engineering Director, Solid State Electronics Lab and Device Characterization Lab University of Central Florida, Orlando, Florida, USA Vice President, IEEE Electron Device Society Treasurer, IEEE Electron Device Society Distinguished Lecturer, IEEE Electron Device Society liou "at" pegasus.cc.ucf.edu Curriculum	Prof. Hiroshi Iwai, Ph.D., Frontier Collaborative Research Center Tokyo Institute of Technology 4259-G2-25 Nagatsuta, Midori-ku, Yokohama, Kanagawa, 226-8502, Japan Tel: +81-45-924-5471, Fax: +81-45-924-5584 E-mail: iwai "at" ep.titech.ac.jp Curriculum
Coordinador visita a Chile: Prof. Nicolás Beltrán M., Dr. App. Sc. Coordinador Area Telecomunicaciones y Electrónica Departamento de Ingeniería Eléctrica Universidad de Chile Teléfono : 56-2-978 4193 Cel: 09-9852 8286 Fax : 56-2-695 3881

Wednesday 22 Nov
9:00 Trip to Valparaíso. Arrival at 10:45hrs
11:00 Electronics Engineering Dept. UTFSM. Prof. Agustín González, Fotos de las visitas con Director
12:00 Talks : Auditorio B221 (Invitación amplia UCV + UTFSM + Apolinav + otros interesados)

Juin J. Liou, Ph.D: Robust Electrostatic Discharge (ESD) Protection in CMOS Technology

Hiroshi Iwai,Ph.D: Miniaturization of Semiconductor Devices for Integrated Circuits
Foto de la visitas con Estudiantes

13:30 Lunch (Club Naval: organizan Guillermo Fernández & Agustín González)
15:00 Electrical Engineering Dept. PUCV. Prof. Edmundo López & Guillermo Fernández, Fotos con Guillermo y Raimundo
16:20 Return to Santiago.

Talk of Dr. Juin J. Liou: Robust Electrostatic Discharge (ESD) Protection in CMOS Technology

Abstract: Electrostatic discharge (ESD) is a process in which a finite amount of charge is transferred from one object (i.e., human body) to the other (i.e., microchip). This process can result in a very high current passing through the microchip within a very short period of time, and more than 35% of chip damages can be attributed to such an event. As such, designing robust on-chip ESD structures to protect microchips against ESD stress is a high priority in the semiconductor industry. An overview on the ESD sources, models, and protection schemes will first be given in this talk. This is followed by examples of a recent development of robust ESD solutions for protecting data communication transceivers and gas-sensor microchips.

Prof. Iwai's Brief History

Name	Hiroshi Iwai
Special field of study	Semiconductor electronics
Degree	Doctor of engineering (the University of Tokyo, March 1992)
School education	- April, 1972 Graduation: the University of Tokyo / Graduate School of Engineering/Faculty of Electronics Engineering
Work experience	- April, 1973 Enter: the Tokyo Shibaura Electric Co., Ltd.(present Toshiba) as a research worker of the Integrated Circuit Research Institute of the General Research Institute - from April, 1977 to September, 1978 Temporary-transfer:Nichiden-Toshiba Co.Ltd. as a research worker of the 6th research institute. - April, 1982 Head Manager of the Toshiba Corp., headquarters of semiconductor enterprise,Semiconductor Technology Research Institute - from March, 1983 to November, 1984 Visiting IC researcher of the Stanford University - April, 1991 Chief research worker of the Toshiba Corp., ULSI Research Institute - October, 1994 Additional post with the head of the Toshiba Corp., LSI the 7th technical Dep., headquarters of semiconductor enterprise - April, 1997 Lead manager of the Toshiba Corp., mircroelectronics technical research institute April, 1999 Professor of Tokyo Institute of Technology It continues till present
Award history	February, 1968 Mayor Nagoya prize November, 1990 the Japan Insutitute of Invention and Innovation Kanto District Encouragement Award April, 1994 Nikkei Business Publications Technical Award Grand-prix December, 1994 IEEE EDS Paul Rappaport Award January, 1997 IEEE Fellow conferment March, 1998 Electronic Information Communication Society, Electronics Award December, 2001 IEEE EDS J.J. Ebers Award August, 2002 JSAP Award for the Best Commentary Paper Jan, 2005 Local Commendation for Invention from Japan Institute of Invention and Innovation
Society Officer etc. (2006.05)	2006 IWNC:Genral Chair 2004/2005 IEEE EDS(Electron Devices Society) President The 9th Workshop and IEEE EDS Mini-colloquia General Chair ISTC 2005�FAssistant Editor IWJT 2005�FGeneral Chair ISTC 2005�FAssistant Editor - Head of IEDM (International Electron Devices Meeting)CMOS, and reliability sub-committee - Vice-head of MIEL (International Conference on Microelectronics)program committee - Common-Head of ICSICT (Int. Conf. on Solid State and IC Technology) program committee the Japan Society of Applied Physics, IEEE cosponsorship - Head of IWJT (International Workshop on Junction Technology) executive committee - Head of IWGI (International Workshop on Gate Insulator)program committee ECS(Electronics Chemical Society) Electronics Division executive committee IEICE, electronics society - Chairperson of English paper magazine IEICE, advisory board - adviser of paper editing IEICE, english paper C editing board - Chairperson of English paper magazine IEEJ, Electronics Device Technology committee - Manager of special comittee for super-micro integrated device investigation Microelectronics Reliability - Chief editor of Asian area National Institution for Academic Degrees - Member and so on
Birth date	April 25, 1949